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Carriers induced at the end of a quantum well

机译:量子阱末端感应的载流子

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摘要

The charge distribution of carriers induced at the end of a quantum well by an auxiliary confining potential perpendicular to the plane of the well has been calculated for two examples. The first example considers a selectively doped layer grown epitaxially on a cleaved quantum well structure. The induced electron density in this case is found to be approximately proportional to the width of the well, with an additional charge from the dopants that project outside the well and with a cutoff at very small well widths as the quantum state is driven above the band offset. The second example considers the effect of surface pinning of the Fermi level above the conduction band edge of InAs.
机译:已经计算了两个例子,计算了垂直于阱平面的辅助约束势在量子阱末端感应的载流子的电荷分布。第一个例子考虑了在裂解的量子阱结构上外延生长的选择性掺杂层。在这种情况下,发现感应电子密度与阱的宽度大致成正比,来自投射到阱外的掺杂剂的额外电荷,并且当量子态被驱动到能带偏移以上时,在非常小的阱宽处具有截止值。第二个示例考虑了费米能级在InAs导带边缘上方的表面固定的影响。

著录项

  • 来源
    《journal of applied physics》 |1992年第2期|809-811|共页
  • 作者

    Frank Stern; Steven E. Laux;

  • 作者单位
  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类
  • 关键词

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