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Microstructure study of amorphous vanadium oxide thin films using raman spectroscopy

机译:基于拉曼光谱的非晶态氧化钒薄膜的微观结构研究

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摘要

Microstructural changes of amorphous V_(2)O_(5) films with lithium intercalation are studied using Raman-scattering measurements. The Raman spectra of as-deposited films show two broad peaks around at 520 and 650 cm~(-1), due to the stretching modes of the V_(3)-O and V_(2)-O bonds, respectively, and a relatively sharp peak at 1027 cm~(-1) due to the V~(5+)=O stretching mode of terminal oxygen atoms. In addition, there is a peak at 932 cm~(-1) that we attribute to the V~(4+)=O bonds. Comparison of the Raman spectra of V_(2)O_(5) films with different oxygen deficiencies confirms this assignment. This Raman peak due to the stretching mode of the V~(4+)=O bonds develops and shifts toward lower frequencies with increasing lithium concentration. Comparison to results from gasochromic hydrogen insertion indicates that the 932 cm~(-1) Raman peak is not a result of vibrations which involve Li or H atoms. We propose that the V~(4+)=O bonds are created by two different mechanisms: a direct conversion from V~(5+)=O bonds and the breaking of the single oxygen bonds involving V~(4+) ions.
机译:采用拉曼散射法研究了具有锂插层的非晶V_(2)O_(5)薄膜的微观结构变化。由于V_(3)-O键和V_(2)-O键的拉伸模式,沉积薄膜的拉曼光谱分别在520和650 cm~(-1)处显示出两个宽峰,由于末端氧原子的V~(5+)=O拉伸模式,在1027 cm~(-1)处显示出一个相对尖锐的峰。此外,在932 cm~(-1)处有一个峰值,我们将其归因于V~(4+)=O键。对不同缺氧的V_(2)O_(5)薄膜的拉曼光谱的比较证实了这一分配。由于V~(4+)=O键的拉伸模式,该拉曼峰随着锂浓度的增加而发展并向较低的频率移动。与气致变色氢插入结果的比较表明,932 cm~(-1)拉曼峰不是涉及Li或H原子的振动的结果。我们提出V~(4+)=O键是由两种不同的机制产生的:V~(5+)=O键的直接转化和涉及V~(4+)离子的单氧键的断裂。

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