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A simplified joint density of states analysis of hydrogenated amorphous silicon

机译:氢化非晶硅的简化节理态密度分析

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摘要

We propose a simplified empirical model for the density of state functions of hydrogenated amorphous silicon that neglects the conduction band tail electronic states. The corresponding joint density of states function is then computed. We find, while this analysis is considerably simplified, that the resultant joint density of states function compares favorably with that determined from an empirical model for the density of states functions with the conduction band tail taken into account. Analytical and asymptotic results, relating the parameters characterizing the underlying density of states functions with the joint density of states function, are developed. The density of states parameters corresponding to hydrogenated amorphous silicon are then determined through an analysis of some hydrogenated amorphous silicon joint density of states experimental data. It is suggested that this simplified empirical model for the density of states functions will prove of greater utility to the experimentalist.
机译:我们提出了一个简化的氢化非晶硅态函数密度经验模型,该模型忽略了导带尾电子态。然后计算相应的联合状态密度函数。我们发现,虽然这种分析被大大简化,但得到的态密度函数与从考虑导带尾部的态密度函数的经验模型中确定的状态密度函数相比是有利的。开发了将表征潜在状态密度函数的参数与联合状态密度函数相关联的解析和渐近结果。然后通过对一些氢化非晶硅节理态密度实验数据的分析,确定氢化非晶硅对应的态密度参数。有人认为,这种简化的状态密度函数经验模型将被证明对实验主义者有更大的用处。

著录项

  • 来源
    《Journal of Applied Physics》 |2002年第8期|4276-4282|共7页
  • 作者单位

    Faculty of Engineering, University of Regina, Regina, Saskatchewan S4S OA2, Canada;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类 应用物理学;
  • 关键词

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