Surface segregation of Nihyphen;Cu alloy in nitrogen and oxygen: An atomhyphen;probe fieldhyphen;ion microscope study

摘要

The energyhyphen;focused timehyphen;ofhyphen;flight atomhyphen;probe fieldhyphen;ion microscope (FIM) is employed to study surface segregation of a Nihyphen;Cu alloy in nitrogen and oxygen. In nitrogen, in addition to the normal enrichment of Cu to the top surface layer as in the vacuum annealing case, highly Cuhyphen;rich regions are formed near plane edges of the top surface layer. In oxygen, no Cu enrichment at the surface is found. Both the composition depth profiles and the spatial distributions of alloy species within an atomic layer can be obtained by the atomhyphen;probe (FIM) with depth and spatial resolution of a few angstroms.