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The influence of hydrogen plasma treatment and proton implantation on the electrical properties of InAs

机译:氢等离子体处理和质子注入对InAs电性能的影响

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摘要

The effects produced in InAs by hydrogen plasma treatment and proton implantation are discussed. It is shown that both treatments can produce ann‐type layer at the surface ofp‐InAs. For the hydrogen plasma treatment the effect is explained by hydrogen donors complexing with the Be and Zn acceptors and rendering them electrically inactive, thus leaving the residual donors uncompensated. In proton implanted samples thep‐nconversion is due to a creation of donor‐type lattice defects.
机译:讨论了氢等离子体处理和质子植入在InAs中产生的影响。结果表明,两种处理都可以在p‐InAs的表面产生ann‐型层。对于氢等离子体处理,其效果可以通过氢供体与 Be 和 Zn 受体络合并使其电失活,从而使残余供体得不到补偿来解释。在质子植入样品中,p&连字符;n转换是由于供体&连字符型晶格缺陷的产生。

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