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Atomic scale simulation of defect production in irradiated 3C-SiC

机译:Atomic scale simulation of defect production in irradiated 3C-SiC

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摘要

Molecular dynamics simulations using a modified Tersoff potential have been used to study the primary damage state and statistics of defect production in displacement cascades in 3C-SiC. Recoils with energies from 0.25 to 50 keV have been simulated at 300 K. The results indicate that: (1) the displacement threshold energy surface is highly anisotropic; (2) the dominant surviving defects are C interstitials and vacancies; (3) the defect production efficiency decreases with increasing recoil energy; (4) defect clusters are much smaller and more sparse compared to those reported in metals; and (5) a small fraction of the surviving defects are antisite defects.

著录项

  • 来源
    《Journal of Applied Physics 》 |2001年第5期| 2303-2309| 共7页
  • 作者单位

    Department of Metallurgical Engineering, Indian Institute of Technology Madras, Chennai 600036, India;

    nl.gov;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类 应用物理学 ;
  • 关键词

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