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Stopping cross sections for 0.3-2.5 MeV protons in GaN and InP

机译:Stopping cross sections for 0.3-2.5 MeV protons in GaN and InP

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摘要

The stopping cross sections of the III-V semiconductor materials GaN and InP for 0.3-2.5 MeV ~(1)H have been studied by the Rutherford backscattering technique. The data are given with an estimated uncertainty better than 2 and the agreement with earlier data existing for InP below 500 keV is good. A commonly used model ZBL-85 predicts the data correctly at the high energy end of our energy interval, but overestimates the stopping values by 7 and 4 for GaN and InP, respectively, at the lower energies.

著录项

  • 来源
    《Journal of Applied Physics》 |2001年第9期|4871-4873|共3页
  • 作者

    T. Ahlgren; E. Rauhala;

  • 作者单位

    Accelerator Laboratory, University of Helsinki, P.O. Box 43, FIN-00014 Helsinki, Finland;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类 应用物理学;
  • 关键词

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