首页> 外文期刊>journal of chemical physics >Response to the critique to the paper lsquo;lsquo;The role of shallow traps on the mobility of electrons in liquid Ar, Kr, and Xersquo;rsquo;
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Response to the critique to the paper lsquo;lsquo;The role of shallow traps on the mobility of electrons in liquid Ar, Kr, and Xersquo;rsquo;

机译:Response to the critique to the paper lsquo;lsquo;The role of shallow traps on the mobility of electrons in liquid Ar, Kr, and Xersquo;rsquo;

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In response to the critique of the previous papers by Freeman and some of the comments by Schnidtetal., it is shown that the electric field dependence of the drift velocity is inconsistent with the hot electron model. The information obtained from the addition of polyatomic impurities to the liquified rare gases is inconsistent with a picture of an average electron energy that is a large fraction of 1 eV. In the following paper it will be shown that the field dependence of the trapping rate constant of electrons with SF6and O2can be quantitatively explained with no reference to hot electrons. (AIP)

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