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Properties of Zn‐doped VPE‐grown GaN. II. Optical cross sections

机译:Zn连字符;掺杂VPE连字符生长GaN的性质。II. 光学截面

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Experimental data are presented for optical cross sections sgr;0n(hngr;) related to the four deep acceptorlike Zn‐related radiative levelsA–Din GaN. Very accurate spectral data were obtained by the photoluminescence excitation (PLE) technique, at temperatures varying from 4.2 up to 293 K. From a detailed comparison of the spectral behavior of the emission and absorption spectra, the size of electronic broadening effects could be determined in the overlap region. The binding energies for Zn‐related acceptor levels were obtained asEA=0.34±0.04,EB=0.65±0.08,EC=1.02±0.05, andED=1.42±0.08 eV at low temperature. Optical transmission data give estimates of absolute values for optical cross sections at saturation, varying from sgr;0nA(sat) ?1×10−16to sgr;nD(sat) ?5×10−18cm2. Temperature broadening effects in optical cross sections are well explained by a linear model for phonon coupling in the optical transitions, employing the same phonon energies and coupling strengths as were evaluated from emission spectra.
机译:给出了与四个深受体Zn‐相关辐射能级A–Din GaN相关的光学截面&sgr;0n(h&ngr;)的实验数据。通过光致发光激发 (PLE) 技术在 4.2 至 293 K 的温度范围内获得了非常准确的光谱数据。通过对发射光谱和吸收光谱的光谱行为的详细比较,可以确定重叠区域中电子展宽效应的大小。Zn&连字符相关受体水平的结合能为EA=0.34±0.04,EB=0.65±0.08,EC=1.02±0.05,ED=1.42±0.08 eV。光传输数据给出了饱和时光学截面绝对值的估计值,从&sgr;0nA(sat)?1×10−16到&sgr;nD(sat)?5×10−18cm2不等。光学横截面中的温度展宽效应可以通过光学跃迁中声子耦合的线性模型得到很好的解释,该模型采用与发射光谱评估的声子能量和耦合强度相同的声子能量和耦合强度。

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