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New features of injection phenomena in graded semiconductor structures with intervalley crossover

机译:具有间隔交叉的梯度半导体结构中注入现象的新特征

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An effect of injected charge carrier accumulation (depletion) at the intervalley crossover of a graded semiconductor has been reported. We proved that an abrupt change in electron mobility in the vicinity of the intervalley crossover was primarily responsible for this effect, whereas a change in the quasielectric field had only a slight effect on the injected carrier coordinate distribution. Photoconductivity spectra were found to be a convenient way of investigating the charge carrier profile in graded structures. The experimental spectra of the diode structures based on a graded AlxGa1−xAs alloy compound have been found in satisfactory agreement with theoretical predictions.
机译:已经报道了在梯度半导体的间隔交叉处注入电荷载流子积累(耗尽)的影响。我们证明了间隔分频器附近电子迁移率的突然变化是造成这种效应的主要原因,而准电场的变化对注入的载流子坐标分布只有轻微的影响。光电导光谱被发现是研究梯度结构中电荷载流子分布的便捷方法。基于梯度AlxGa1−xAs合金化合物的二极管结构的实验光谱与理论预测结果吻合,结果令人满意。

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