首页> 外文期刊>Journal of Applied Physics >Electronic property variations due to an embedded potential barrier layer in modulation-doped step quantum wells
【24h】

Electronic property variations due to an embedded potential barrier layer in modulation-doped step quantum wells

机译:调制掺杂步进量子阱中嵌入电位势垒层导致的电子性质变化

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

Electronic property variations of a two-dimensional electron gas (2DEG) in modulation-doped step quantum wells due to an embedded potential barrier were studied by performing Shubnikov-de Haas (SdH), Van der Pauw-Hall-effect, and cyclotron resonance measurements on two kinds of In_(x)Ga_(1-x)As/In_(y)Al_(1-y)As step quantum wells which were one without and the other with an embedded barrier. The fast Fourier transformation results for the SdH data at 1.5 K indicated the electron occupation of two subbands in both step quantum wells. The total electron carrier density and the mobility of the 2DEG in the step quantum well with an embedded barrier were smaller than those in the quantum well without an embedded barrier. The electron effective masses were determined from the slopes of the main peak absorption energies as functions of the magnetic field, and satisfied qualitatively the nonparabolicity effects in both quantum wells. The electronic subband energies, the wave functions, and the Fermi energies were calculated by using a self-consistent method taking into account exchange-correlation effects together with strain and nonparabolicity effects. These present results indicate that the electronic parameters in modulation-doped In_(x)Ga_(1-x)As/In_(y)Al_(1-y)As step quantum wells are significantly affected by an embedded barrier.
机译:通过对两种In_(x)Ga_(1-x)As/In_(y)Al_(1-y)As阶梯量子阱进行Shubnikov-de Haas(SdH)、Van der Pauw-Hall效应和回旋加速器共振测量,研究了调制掺杂阶梯量子阱中二维电子气体(2DEG)由于嵌入势垒引起的电子性质变化。SdH数据在1.5 K处的快速傅里叶变换结果表明,两个阶跃量子阱中两个子带的电子占有率。具有嵌入式势垒的阶梯量子阱中2DEG的总电子载流子密度和迁移率均小于没有嵌入式势垒的量子阱中。根据主峰吸收能的斜率确定电子有效质量作为磁场的函数,定性地满足了两个量子阱中的非副虚线效应。采用自洽方法计算了电子子带能量、波函数和费米能量,并考虑了交换相关效应以及应变和非副虚度效应。这些结果表明,调制掺杂In_(x)Ga_(1-x)As/In_(y)Al_(1-y)As阶跃量子阱中的电子参数受到嵌入式势垒的显著影响。

著录项

获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号