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Epitaxial PbSe and Pb1−xSnxSe: Growth and electrical properties

机译:外延 PbSe 和 Pb1−xSnxSe:生长和电学性质

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摘要

Epitaxial layers of PbSe and Pb1−xSnxSe have been grown on cleaved BaF2and SrF2single‐crystal substrates by vacuum deposition of the evaporated binary compounds. The influence of the effusion conditions on the stoichiometry of the molecular beam is considered and it is shown that evaporation of PbSe results in two‐phase layers that contain precipitated lead. Coevaporation of selenium compensated the excess lead and permitted the control ofn‐ orp‐type carrier concentrations in epitaxial layers in the range 3×1016−6×1017cm−3. Structural studies indicate that the layers are single crystals with about the same concentration of low‐angle grain boundaries as observed on the substrates. Low‐temperature Hall mobilities were measured that are as large as those obtained with annealed bulk crystals. The value 4.8×105cm2/V sec for a PbSe layer with 9.2×1016hole cm−3is the largest mobility measured for this material. Below 77°K the mobilities depend markedly on carrier concentration and thermal history of the specimens.
机译:通过蒸发的二元化合物的真空沉积,在裂解的BaF2和SrF2单晶底上生长了PbSe和Pb1−xSnxSe的外延层。考虑了渗出条件对分子束化学计量的影响,结果表明,PbSe的蒸发导致含有沉淀铅的两相层。硒的共蒸发补偿了多余的铅,并允许控制外延层中n&连字符;orp‐型载流子浓度在3×1016−6×1017cm−3范围内。结构研究表明,这些层是单晶,其低&连字符角晶界的浓度与在衬底上观察到的大致相同。测量了低温霍尔迁移率,其迁移率与退火块状晶体获得的霍尔迁移率一样大。对于孔径为 9.2×1016 cm−3 的 PbSe 层,4.8×105cm2/V sec 的值是该材料测得的最大迁移率。在低于77°K时,迁移率明显取决于载流子浓度和试样的热历史。

著录项

  • 来源
    《journal of applied physics》 |1974年第2期|892-897|共页
  • 作者

    D. K. Hohnke; S. W. Kaiser;

  • 作者单位
  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 英语
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