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Raman study of Zn_(1-x)Be_(x)Se/GaAs systems with low Be content (x≤0.20)

机译:低铍含量Zn_(1-x)Be_(x)Se/GaAs系统的拉曼研究(x≤0.20)

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摘要

We present an experimental and theoretical investigation of the Raman line shape of long-wavelength phonons with longitudinal optical (LO) symmetry from both sides of Zn_(1-x)Be_(x)Se/GaAs (001) heterojunctions with special emphasis on samples with low Be content (x≤0.20). First the built-in p-type LO phonon-plasmon (LO-P) coupled mode at the near-interfacial substrate is used as a sensitive probe to investigate the interfacial quality. The corresponding hole gas is reinforced when the ZnBeSe layers are nominally p doped by nitrogen. This provides clear evidence for effective hole transfer across the junction, and thereby indicates a minimized density of interfacial defects. In the nitrogen-doped layers hole densities as high as 10~(17) cm~(-3), in accordance with capacitance-voltage measurements, are directly inferred from clear weakening of the ZnSe-like LO mode due to LO-P coupling. Concerning the intrinsic properties of the alloys, we demonstrate that the asymmetric broadening of the ZnSe-like LO mode is determined by topological disorder only, and not by other possible mechanisms such as structural disorder, nonhomogeneity in the alloy composition, a distribution of tensile strain, or a Fano-type interference. This reveals a high structural quality that parallels the high interfacial quality. We also show that a spatial correlation model with Gaussian distribution applies to Zn_(1-x)Be_(x)Se. Most of this study is supported by a quantitative treatment. We extend the phenomenological approach of Hon and Faust to equations of motion and polarization derived from the modified-random-element-isodisplacement model in order to achieve line shape analysis of the alloy-related LO and LO-P modes.
机译:我们提出了从Zn_(1-x)Be_(x)Se/GaAs(001)异质结两侧具有纵向光学(LO)对称性的长波长声子的拉曼线形的实验和理论研究,特别强调了低Be含量(x≤0.20)的样品。首先,利用近界面衬底内置的p型LO声子-等离子体(LO-P)耦合模式作为灵敏探针,研究了界面质量;当ZnBeSe层标称p掺杂氮气时,相应的空穴气体得到增强。这为跨结的有效空穴转移提供了明确的证据,从而表明界面缺陷的密度最小化。在氮掺杂层中,根据电容-电压测量,孔密度高达10~(17) cm~(-3),直接推断出LO-P耦合导致类ZnSe LO模式明显减弱。关于合金的内在性质,我们证明了类ZnSe LO模式的不对称展宽仅由拓扑无序决定,而不是由其他可能的机制决定,例如结构无序,合金成分的非均匀性,拉伸应变的分布或Fano型干涉。这揭示了与高界面质量平行的高结构质量。我们还表明,具有高斯分布的空间相关模型适用于Zn_(1-x)Be_(x)Se。这项研究的大部分内容都得到了定量治疗的支持。我们将 Hon 和 Faust 的现象学方法扩展到从修正的随机元素等位移模型推导出的运动和极化方程,以实现合金相关 LO 和 LO-P 模式的线形分析。

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