Scanning tunneling spectroscopy of Ag-As-Se ion-conducting glasses

摘要

Electronic structures of Ag-As-Se glasses, which possess ion-hole mixed conduction, have been studied using a scanning tunneling microscope operating in tunneling-spectroscopy modes. The tunneling spectra show marked dependence on the scan speed of tip voltage. This scan-speed dependence appears to be caused by Ag↑(+)-ion migration which is induced by electric fields generated by tips. # 1997 American Institute of Physics. S0003-6951(97)02549-7