Comments on lsquo;lsquo;An analytical study of thephyphen;njunction spacehyphen;charge region under high forward voltagersquo;rsquo; lsqb;J. Appl. Phys.62, 948 (1987)rsqb;

摘要

The recent findings of Park, Lindholm, and Neugroschel lsqb;J. Appl. Phys.62, 948 (1987)rsqb; regarding the depletion capacitance ofphyphen;njunctions of the symmetricalhyphen;step type and of the linearly graded type under highhyphen;forward voltage are compared to the results of an earlier analysis of the same subject. The difference in the method of solution and the role of a characteristic length in linearly graded junctions is briefly discussed.