A highhyphen;resolution xhyphen;ray diagnostic technique using simultaneous diffraction from several planes of acid phthalate crystals

摘要

An xhyphen;ray diagnostic tool was developed for acquiring and interpreting highhyphen;resolution spectra for hothyphen;plasma emission from selected elements. A convex, curved potassium acid phthalate (KAP) crystal was used to collect spectral data from an explodedhyphen;A1hyphen;wire plasma over a wide exposure latitude with the 001, 002, and the 013 planes simultaneously diffracting. The curvedhyphen;crystal diffraction efficiencies were calculated for these three planes in KAP and evaluated with xhyphen;ray line intensities derived from the experimental A1 data. The crystal efficiencies were also computed for two other commonly used acid phthalate crystals rubidium acid phthalate (RAP) and thallium acid phthalate (TAP), to compare with KAP crystals. The calculated efficiencies for the firsthyphen;order diffraction in KAP, RAP, and TAP agreed with available experimental data.