Electron escape depths of organic solids. II. The energy dependence of naphthacene and perylene films

摘要

The energy dependence of the electron escape depth of naphthacene and perylene deposited films has been measured by an overlayer technique. Energy distribution curves of transmitted electrons through deposited organic layers were obtained by differentiating the Indash;V characteristic curves, and the electron escape depths classified by their kinetic energies were obtained from the above results. Presently obtained escape depth is between 8 and 15 nm for naphthacene and between 30 and 37 nm for perylene. They differ from our previous results, and the reason for this discrepancy is discussed.