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Spectral density due to the fluctuation of the total number of carriers in a semiconductor

机译:Spectral density due to the fluctuation of the total number of carriers in a semiconductor

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摘要

By applying stochastics and thermodynamics, a formulation for deriving the spectral density due to the fluctuation of the total number of carriers in a semiconductor is suggested. From establishing and solving the master equations concerning the involved conditional probability functions, the autocorrelation and the cross correlation of the occupancy fluctuations can be obtained. The derived form of the spectral density due to the fluctuation of the total number of carriers is proportional to the equilibrium total number of carriers in the semiconductor, and becomes 1/fnoise spectrum when the power index of the relaxation times is large.

著录项

  • 来源
    《journal of applied physics 》 |1985年第2期| 318-321| 共页
  • 作者

    Chung H. Suh;

  • 作者单位
  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类
  • 关键词

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