A columnar‐growth mode in strained compositionally modulated Cu‐Ni: Cross‐sectional electron microscopy

摘要

A columnar structure and a toothlike surface morphology were observed for a compositionally modulated Cu6.8‐Ni7.0film by cross‐sectional transmission electron microscopy (XTEM). The surface facets were found to be nearly crystallographic planes. The coherency strains are considered, in discussing these XTEM observations, in conjunction with the nonequilibrium growth conditions, x‐ray diffraction data, and characteristics of Cu and Ni. Their importance in the growth as well as in determining physical properties of such systems is also discussed.