Structures of grain boundaries and triple line junctions in nanocrystall me materials are of interest owing to large fractions of atoms in nanocrystalline materials being at these interfacial positions. Grain boundary and triple line junction structures in nanocrystal line palladium have been studied using high-resolution transmission electron microscopy (HRTEM). The main microstructural features observed include the varying atomic structures of grain boundaries and the presence of disordered regions at triple line junctions. Also, there is variation in lattice parameters in different nanocrystalline grains. Geometric phase analysis is used to quantify atomic displacements within nanocrystalline grains. Displacement fields thus detected indicate links to the interface structures.
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