This report studies reflection and transmission of a TE plane wave from a 1D random thin film with slanted fluctuation by means of the stochastic functional approach,. By starting with a result for a 2D random thin film in the previous paper IEICE Trans. Electron., Vol. E92-C, no.1, pp.77-84, 2009, the corresponding random wavefield representation and its statistical properties for 1D cases are formally derived when a correlation length of fluctuation goes to infinity. For several 1D random thin films, the first-order incoherent scattering cross section and the optical theorem are computed. 0041D random medium, thin film, slanted fluctuation, reflection and transmission, stochastic functional approach
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