High‐purity InP crystals were prepared by the synthesis, solute diffusion (SSD) technique. By vacuum baking of raw indium at 900 °C for 6 h, the first‐to‐freeze part of InP had a carrier concentration ofND−NA= 6.4×1014cm−3at 300 K and a mobility of mgr; = 79 100 cm2/V sec at 77 K. It is concluded that S and/or Si contained in In raw material are dominat donor impurities in the SSD‐InP crystal, because their contents can be decreased by the vacuum baking.
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