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Physical Properties, Intrinsic Defects, and Phase Stability of Indium Sesquioxide

机译:倍半氧化铟的物理性质、固有缺陷和相稳定性

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摘要

We report an accurate and robust interatomic pair potential for the technologically important transparent conducting oxide indium sesquioxide (In2O3). The potential is optimized for the thermodynamically stable bixbyite phase, and it is then used to explore the relative stability and physical properties of five sesquioxide polymorphs and their high-pressure phase transitions. The potential is further employed to investigate the formation of intrinsic defects at the limit of infinite dilution through the embedded Mott-Littleton approach. The anion Frenkel pair is determined to be the lowest energy source of ionic disorder with an energy of formation of 3.2 eV per defect, which can be explained by the presence of intrinsic anion vacancy sites in the bixbyite structure. In contrast, both the cation Frenkel pair (6.9 eV) and Schottky defect (4.4 eV) are less thermodynamically stable. The Schottky formation energy is less in the high pressure phases; however, it remains above 4 eV at elevated pressures.
机译:我们报告了技术上重要的透明导电氧化物倍半氧化铟(In2O3)的准确而稳健的原子间对电位。针对热力学稳定的双叶石相优化了该势,然后用于探索5种倍半氧化物多晶型及其高压相变的相对稳定性和物理性质。进一步利用该势通过嵌入式 Mott-Littleton 方法研究了无限稀释极限下内在缺陷的形成。阴离子弗伦克尔对被确定为离子无序的最低能量源,每个缺陷的形成能量为 3.2 eV,这可以通过双叶岩结构中存在固有阴离子空位点来解释。相比之下,阳离子弗伦克尔对(6.9 eV)和肖特基缺陷(4.4 eV)的热力学稳定性都较差。高压相的肖特基地层能量较小;然而,在高压下,它仍然高于 4 eV。

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