Comment on rsquo;rsquo;A unified explanation for secondaryhyphen;ion yields and rsquo;rsquo;mechanism of the SIMS matrix effectrsquo;rsquo;

摘要

Experimental data on secondaryhyphen;ions yields recently reported by Delineetal. are analyzed critically. It is shown that whereas the results for oxygen bombardment support earlier findings concerning positivehyphen;secondaryhyphen;ion emission, the negativehyphen;ion yields observed under cesium impact reveal previously unknown features. A unified explanation for secondaryhyphen;ion yields cannot be deduced from the published results. Simple (exponential) laws may be found only under certain experimental conditions or after averaging procedures.