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Structure-independent universality of Barkhausen criticality in iron nitride thin films

机译:Structure-independent universality of Barkhausen criticality in iron nitride thin films

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摘要

Discrete and jerky jumps during the process of magnetization reversal in ferromagnetic systems cause Barkhausen intermittency. We have investigated critical scaling behavior of the Barkhausen avalanche of 2-dimensional γ-Fe_4N thin films using a magneto-optic microscope magnetometer (MOMM) capable of time-resolved magnetic domain images. A statistical analysis of the fluctuating size of Barkhausen jumps from numerous repetitive experiments shows a power-law scaling behavior in the ferromagnetic iron nitride system exhibiting a critical exponent value of τ=1.02 within the experimental error. The value of critical exponent is found to manifest universality irrespective of the degree of texture of the film induced by annealing temperature.

著录项

  • 来源
    《Solid State Communications》 |2010年第28期|1169-1172|共4页
  • 作者单位

    School of Science and Engineering (SSE), Lahore University of Management Sciences (LUMS), D.H.A. Lahore-54792, Pakistan;

    Center of Excellence in Solid State Physics, University of the Punjab, Lahore-54590, Pakistan;

    Department of Physics, Center for Nanospinics of Spintronic Materials, Korea Advanced Institute of Science and Technology (KAIST), Daejeon-305-701, South Korea;

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  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类 固体物理学;
  • 关键词

    Epitaxy; Thin films;

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