MTR-Fill: A Simulated Annealing-Based X-Filling Technique to Reduce Test Power Dissipation for Scan-Based Designs

摘要

This paper proposes the minimum transition random X-filling (MTR-fill) technique, which is a new X-filling method, to reduce the amount of power dissipation during scan-based testing. In order to model the amount of power dissipated during scan load/unloa