The photoluminescence of Ge‐doped AlxGa1−xAs grown by liquid phase epitaxy (LPE) was investigated. The ionization energy of Ge, determined from the photoluminescence spectra, has a strong relation to the Al composition. This cannot be explained by a simple effective mass‐like expression. The broad emission band with a peak at about 1.5 eV, which has been observed by several investigators, was studied further. The intensity of the emission band increased as Ge or as implanted O concentration increased. The peak energy shifted toward higher energy as excitation intensity increased. The paper suggests that this emission band is caused by O donor‐Ge acceptor pair recombination.
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机译:研究了液相外延(LPE)生长的Ge‐掺杂AlxGa1−xAs的光致发光.根据光致发光光谱确定的Ge的电离能与Al组成有很强的关系。这不能用简单有效的质量&连字符表达式来解释。进一步研究了峰值约为 1.5 eV 的宽发射带,该波段已被几位研究人员观察到。发射带的强度随着Ge或植入O浓度的增加而增加。随着激发强度的增加,峰值能量向更高能量转移。该论文表明,该发射带是由O供体&连字符Ge受体对重组引起的。
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