Intentionally grown GaN inversion domain boundaries (IDBs) of lateral polarity heterostructures have been spectroscopically imaged at low temperature using high spatial resolution photoluminescence. It is shown that the IDBs are not only optically active, but are more than an order of magnitude brighter than the GaN bulk material. Our findings are in agreement with calculations predicting that IDBs should not adversely affect near-band-gap photoluminescence due to the absence of midgap electronic states. Typical linewidths are on the order of 10-20 meV, however, features less than 0.6 meV are observed. The boundary emission is found to be neither spectrally nor spatially uniform. Also, a strong polarization dependence of the IDB photoluminescence is measured and determined to be oriented parallel to the boundary between GaN of N- or Ga-face polarity.
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