首页> 外文期刊>journal of applied physics >Liquid junctions for characterization of electronic materials. II. Photoreflectance and electroreflectance ofn‐Si
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Liquid junctions for characterization of electronic materials. II. Photoreflectance and electroreflectance ofn‐Si

机译:用于表征电子材料的液结。II. 光反射率和电反射率 ofn‐Si

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We compare the photoreflectance of then‐Si/air interface with the electrolyte‐electroreflectance and electrolyte‐photoreflectance of then‐Si/methanol interface. We observe reversible changes in line shape and in peak position of the photoreflectance signals, upon introduction of the electrolyte. The methanol proved to be the constituent that drives these changes. We have interpreted the effect of the electrolyte to be due to modifications of the kinetics of equilibration between the surface states and the space‐charge layer. This is supported by the frequency dispersion experiments in which we have demonstrated that the presence of the methanolic electrolyte causes a decrease in the relaxation time of the surface states by more than an order of magnitude.
机译:我们比较了当时&连字符;Si/空气界面的光反射率与电解质&连字符;电反射率和电解质&连字符;Si/甲醇界面的光反射率.我们观察到引入电解质后,光反射信号的线形和峰值位置发生了可逆变化。甲醇被证明是驱动这些变化的成分。我们将电解质的影响解释为由于表面态和空间电荷层之间的平衡动力学的改变。频率色散实验支持了这一点,在该实验中,我们已经证明甲醇电解质的存在导致表面状态的弛豫时间减少一个数量级以上。

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