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Nanoscale investigation of fatigue effects in Pb(Zr,Ti)O3films

机译:Nanoscale investigation of fatigue effects in Pb(Zr,Ti)O3films

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Scanning force microscopy has been used to perform a comparative nanoscale study of domain structures and switching behavior of Pb(ZrxTi1minus;x)O3(PZT) thin films integrated into heterostructures with different electrodes. The study revealed a significant difference between polarization state of ashyphen;deposited PZT films on RuO2and Pt electrodes. The PZT/RuO2films exhibit polydomain crystallites and show almost symmetric switching behavior, while the PZT/Pt films are mainly in a single polarity state and exhibit highly asymmetric piezoelectric hysteresis loops. Formation of unswitchable polarization within the grains of submicron size as a result of fatigue process was directly observed. copy;1996 American Institute of Physics.

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  • 来源
    《applied physics letters》 |1996年第21期|3191-3193|共页
  • 作者单位
  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类
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