An engineering technique is proposed for determining the complex refractive index and thickness of absorbing films on a transparent substrate, based on a measurement of the transmittances of the s and p components at a fixed wavelength for two angles of incidence of the radiation. Two samples with known thickness ratio of the films are used in this case.
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机译:提出了一种工程技术,用于确定透明基板上吸收膜的复杂折射率和厚度,该技术基于对两个辐射入射角的固定波长下 s 和 p 分量的透射率的测量。在这种情况下,使用两个具有已知厚度比的薄膜样品。
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