Piezoelectric properties of rhombohedral Pb(Zr,Ti)O_(3) thin films with (100), (111), and 'random' crystallographic orientation

摘要

The longitudinal d_(33) piezoelectric coefficient was studied in rhombohedral Pb(Zr_(0.6)Ti_(0.4))O_(3) thin films with (111), (100), and "random" orientation. The largest d_(33) was found in (100)-oriented films and the smallest along the polarization direction in (111)-oriented films. These results are in a good qualitative agreement with recent theoretical predictions Du, Zheng, Belegundu, and Uchino, Appl. Phys, Lett. 72, 2421 (1998). The field dependence of d_(33) was also investigated as a function of crystallographic orientation of the films. It was found that (100)-oriented films with the highest piezoelectric coefficient exhibit the weakest nonlinearity. Observed variation in the piezoelectric nonlinearity with film orientation can be fully explained by taking into account domain-wall contributions, which are dependent on film orientation.