机译:Microdefects and point defects optically detected in Cu(In,Ga)Se-2 thin film solar cells exposed to the damp and heating
Wyatt Technology Corporation 6300 Hollister Avenue, Santa Barbara, CA 93117-3253;
Thin film solar cell; Chalcopyrite semiconductor; Point defects; Microdefects; Damp beating; Cuinse2; Photoluminescence; Modules; Window; Layer;