机译:使用神经模型和约束参数提取的射频电路中的模拟总故障识别
Intel Corp, Zapopan 45109, Mexico;
ITESO Jesuit Univ Guadalajara, Dept Elect Syst & Informat, Tlaquepaque 45604, Mexico;
Analog faults; artificial neural network (ANN); fault identification; fault injection; gross faults; parameter extraction;