Differential microscopy by conventional electron offhyphen;axis holography

摘要

Differential microscopy is realized by conventional offhyphen;axis electron holography with an electron biprism behind the specimen. Two phase images reconstructed from two holograms which are obtained with slightly different potentials of the electron biprism are utilized to make a onehyphen;dimensional differential image. Polystyrene latex particles which are charged by electron irradiation are used to demonstrate that the differential image is independent of the distortion of a reference wave. copy;1996 American Institute of Physics.