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机译:Depth profiling by AFM nanoindentations and micro-FTIR spectroscopy for the study of polymer ageing
Univ Clermont Ferrand, Photochim Mol & Macromol Lab, CNRS, UMR 6505, F-63177 Aubiere, France;
atomic force microscopy (AFM); degradation; epoxy; indentation; polycarbonates; TRANSFORM-INFRARED-SPECTROSCOPY; ATOMIC-FORCE MICROSCOPE; NANOMECHANICAL PROPERTIES; SHORT WAVELENGTHS; PHENOXY RESINS; PHOTOOXIDATION; DEGRADATION; CONTACT; PHOTOPRODUCTS; POLYETHYLENE;