机译:A comparison of approaches for valid variogram achievement
Department of Mathematics for Science and Technology, University of Minho, 4800-058 Guimaraes, Portugal;
Department of Statistics and O.R., University of Vigo, Campus A Xunqueira, Pontevedra 36005, Spain;
Department of Statistics and O.R., University of Santiago de Compostela, Campus Sur, Santiago de Compostela 15771, Spain;
Spatial dependence; Empirical variogram; Valid model; Fitting criteria; Non-parametric estimation;