A New ATPG-based Logic Optimization Method by Removing the Redundant Multiple Faults

摘要

In this paper, we propose a logic optimization method to remove the redundancy in the circuit. The incremental Automatic Test Pattern Generation method is used to find the redundant multiple faults. In order to remove as many redundancies as possible, instead of removing the redundant single faults first, we clear up the redundant faults from higher cardinality to lower cardinality. The experiments prove that the proposed method can successfully eliminate more redundancies comparing to the redundancy removal command in the synthesis tool SIS.