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机译:Origin of swift heavy ion induced stress in textured ZnO thin films: An in situ X-ray diffraction study
Materials Science Group, Inter-University Accelerator Centre, Aruna Asaf Ali Marg, New Delhi 110 067, India;
Centre de Spectromtrie Nucléaire et de Spectromtrie de Masse, Batiment 108, F-91405 Orsay Campus, France;
A. ZnO; B. Ion irradiation; C. Structural strain and lattice defects; E. In-situ X-ray diffraction;