机译:A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint
Graduate School of Industrial Technology, Nihon University, Narashino-shi, 275-8575 Japan;
College of Industrial Technology,Nihon University, Narashino-shi, 275-8575 Japan;
Graduate School of Information Science, Nara Institute of Science and Technology (NAIST), Ikomashi, 630-0192 Japan;
state-observable FSMs; logical fault testing; timing fault testing; fault sensitization coverage; n-detection;