We fabricate scanning near-field optical microscope (IRSNOM) probe tips made from singlemode chalcogenide fiber and test them using a standard SNOM setup and free-electron laser. SEM micrographs, showing tips with submicrometer physicaldimensions, demonstrate the feasibility of the thermal micropipette puller process used to create the tips. Topographical data obtained using a shear-force near-field microscope exhibit spatial resolution in the range of 80 to 100 nm. Optical data in theIR (near 3.5μm), using the probe tips in collection mode, indicate an optical spatial resolution of approximately λ/15.
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