NIST, Ceramics Division, Gaithersburg, MD 20899-8523

摘要

X-ray diffraction topography, which is sensitive to local strain and/or crystallographic orientation, provides a unique view of the surface of single-crystal samples and can be used to nondestructively inspect for surface and subsurface damage The attributes of synchrotron-based X-ray topography as applied to inspection will be described and illustrated with examples from recent experiments.