Eigen-signatures for regularity-based I{sub}(DDQ) testing

摘要

We have proposed I{sub}(DDQ) testing deep submicron(DSM) devices on exploiting the regularity of defect-free I{sub}(DDQ) signatures. This paper demonstrates: (1) A new methodology based on eigen-signatures; (2) The fundamental characteristics of the regularity; (3) The I{sub}(DDQ) values related to a test vector set have a small variation, whereas, the I{sub}(DDQ) magnitudes have a large variation.