Special Section on Test, Diagnosis and Verification of SOCs

摘要

The Seventeenth Asian Test Symposium (ATS'08) and the Ninth Workshop on RTL and High Level Testing (WRTLT'08) were held in Sapporo, Japan in November, 2008. A lot of excellent works on state-of-the-art test technologies were presented in ATS'08, while WRTLT'08 provided a forum for more frank discussion focusing on register transfer level and high level testing. Taking this opportunity, we planed this special section to solicit and encourage researches on test, diagnosis and verification of SOCs.