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Optical properties of undoped, Be-doped, and Si-doped wurtzite-rich GaAs nanowires grown on Si substrates by molecular beam epitaxy

机译:分子束外延法在Si衬底上生长的未掺杂、Be掺杂和Si掺杂富纤锌矿砷化镓纳米线的光学性能

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摘要

The photoluminescence (PL) of undoped, Si-doped, and Be-doped GaAs nanowires (NWs) grown on Si substrates by molecular beam epitaxy was investigated. PL peaks of the undoped and Be-doped NWs were observed at higher energies than the bandgap energy of GaAs bulk. According to X-ray diffraction analysis, the blue-shift is attributed to the wurtzite-rich GaAs NW structure. Impurity-related peaks were observed in the undoped NWs and the impurity was Si that diffused via interaction with the adatoms on the Si surface during the growth. A slight bandgap narrowing of the Be-doped GaAs NWs was observed from their PL spectra. The Si-doped NWs showed a very broad PL peak due to a larger density of Si-related defects originating from the heavy doping level. The dependence of the PL peaks of the NWs on temperature was also investigated.
机译:研究了分子束外延法在Si衬底上生长的未掺杂、Si掺杂和Be掺杂的GaAs纳米线(NWs)的光致发光(PL)。未掺杂和Be掺杂NWs的PL峰在高于GaAs块体的带隙能量下观察到。根据X射线衍射分析,蓝移归因于富含纤锌矿的GaAs NW结构。在未掺杂的NWs中观察到与杂质相关的峰,杂质是Si,在生长过程中通过与Si表面的棉原子相互作用而扩散。从PL光谱中观察到Be掺杂的GaAs NWs的带隙略有变窄。由于重掺杂水平导致的Si相关缺陷密度较大,Si掺杂NW显示出非常宽的PL峰。还研究了NW的PL峰对温度的依赖性。

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