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Determination of the layer included in an interference coating that maximally influences correspondence of the spectral reflectance curve of the fabricated coating to the synthesized coating reflectance

机译:确定干涉涂层中包含的层,该层对制造涂层的光谱反射率曲线与合成涂层反射率的对应关系产生最大影响

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摘要

An analysis is performed of the influence of differences in the optical thickness of the layers in the structure of an interference coating that arise in fabrication from the calculated optical thicknesses on the spectral properties of its reflectance. An integral method of searching for a layer that maximally affects the stability of the spectral reflectance curve of the coating is considered. The results obtained in the work revealed the connection of any layer that has deviations in the optical thickness from the calculated thickness with the spectral reflectance curve of the interference coating. (C) 2018 Optical Society of America
机译:分析了从计算的光学厚度到制造过程中产生的干涉涂层结构中层的光学厚度差异对其反射率的光谱特性的影响。考虑了一种寻找对涂层光谱反射率曲线稳定性影响最大的层的整体方法。该工作的结果揭示了任何光学厚度与计算厚度有偏差的层与干涉涂层的光谱反射率曲线的连接。(C) 2018年美国光学学会

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