On the determination of charge centroids in insulators by photoinjection or photodepopulation

摘要

Under certain conditions the centroid of a trapped charge distribution in an MOS insulator can be determined from charge and flatband shift measurements during photoinjection or photodepopulation. This technique was applied earlier by Harari and Royce, who made an erroneous assumption in deriving their equation. The correct equations are derived in the present letter, and the trap structure of pyrolytic Al2O3films is reinterpreted.