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外文期刊>Journal of Materials Science Letters
>Chain length dependent polymorphism in even numbern-alkanes: line profile analysis of synchrotron powder X-ray diffraction data
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Chain length dependent polymorphism in even numbern-alkanes: line profile analysis of synchrotron powder X-ray diffraction data
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机译:Chain length dependent polymorphism in even numbern-alkanes: line profile analysis of synchrotron powder X-ray diffraction data