机译:Exponential discriminative metric embedding in deep learning
Nankai Univ, Ctr Combinator, Tianjin 300071, Peoples R China;
Tianjin Univ, Ctr Appl Math, Tianjin 300072, Peoples R China;
Tianjin Univ, Sch Math, Tianjin 300072, Peoples R China;
Deep metric learning; Object recognition; Face verification; Intra-class compactness; Inter-class separability;