机译:On-Chip Detection of Process Shift and Process Spread for Post-Silicon Diagnosis and Model-Hardware Correlation
Department of Communications and Computer Engineering, Kyoto University, Kyoto-shi, 606-8501 Japan;
Department of Communications and Computer Engineering, Kyoto University, Kyoto-shi, 606-8501 Japan,JST, CREST, Japan;
process shift; process spread; monitor structure; post-silicon analysis; delay test; adaptive test;